Abstract #4866
Worst-Case Analysis of RF-Induced Heating During MRI Scanning in a Generic Multi-Component Orthopedic Medical Implant Applying the Design of Experiment Method (DoE)
Mahdi Abbasi 1,2 , Gregor Schaefers 1 , Juan D. Snchez 1 , and Daniel Erni 2
1
MR:comp GmbH, Gelsenkirchen, NRW, Germany,
2
General
and Theoretical Electrical Engineering (ATE), University
of Duisburg-Essen, Duisburg, NRW, Germany
MRI is known as a non-invasive imaging technique of the
inner parts of the body. Temperature rise in surrounding
tissue of a metallic implant needs to be calculated
carefully for the patients safety. Calculating spatial
induced electric field and SAR become more complex when
the implant is non-uniform in shape and contains several
parts. The effect of each component of a multi-component
generic hip implant on RF heating has been studied by
applying the Design of Experience (DoE) method. By using
Taguchi method, the effect of each variable could be
estimated as well as any arbitrary configuration of the
implant including worst and safest configurations.
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