Abstract #0647

MRI Safety Assessment of Orthopedic Implants on the Bone Surface via the Induced Tangential E-Fields

Manuel Murbach¹, Earl Zastrow¹, Esra Neufeld¹, Theodoros Samaras², Wolfgang Kainz³, and Niels Kuster^1,4

¹ITIS Foundation, Zurich, Switzerland, ²Department of Physics, Aristotle University of Thessaloniki, Thessaloniki, Greece, ³Center for Devices and Radiological Health (CDRH), US Food and Drug Administration (FDA), Silver Spring, MD, United States, ⁴Swiss Federal Institute of Technology (ETH), Zurich, Switzerland

Orthopedic implant manufacturers produce a large portfolio of on-bone devices. Current implant RF safety standards, e.g., ASTM F2182-11a and TS/ISO 10974, do not take advantage of very well-defined data on relevant RF exposures of these devices, i.e., E-fields tangential to the bone-surface. In our approach presented here, we explore the use of the bone-surface-averaged tangential E-field as a close approximation of the incident field impacting an on-bone orthopedic device. The relevant surface-averaged tangential E-fields are less than half of the corresponding peak volume-averaged E-fields, which allows for realistic but not overly conservative assessment of RF implant safety in MRI.

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