At 64 and 127.7 MHz RF-induced heating on or near nine distal radius implant systems was investigated. The 3-D temperature distribution after 15 minutes continuous excitation was obtained for a plane wave incident field. For one implant, random trials followed by a gradient-based investigation revealed three screw configurations that resulted in a high maximum temperature rise. Due to the smooth outcome of random trials followed by a gradient analysis, even relatively small simulation numbers allowed to reveal the configuration with the highest temperature rise for a given incident electrical field.
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