Abstract #3296
On the Signal-to-Noise Ratio of MR-Based Electrical Properties Tomography
Seung-Kyun Lee 1 , Selaka Bandara Bulumulla 1 , and Ileana Hancu 1
1
GE Global Research, Niskayuna, NY, United
States
We present calculation of the random noise-limited
signal-to-noise ratio (SNR) in MR-based electrical
properties tomography (MREPT). We find that the SNR in
the relative permittivity and electrical conductivity is
determined primarily by the SNR of the magnitude and the
phase of the B1+ map, respectively. In addition, the SNR
is proportional to the square of the linear dimension of
the region-of-interest, to the square root of the number
of voxels, and to the inverse square of the RF length
scales in the medium. Our results can inform design of
MREPT experiments with a desired SNR.
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