Abstract #0962
Influence of T1 contrast and resolution on myelinated cortical thickness at 7 Tesla
Pierre-Louis Bazin 1 , Christine Lucas Tardif 1 , Arno Villringer 1 , and Nicholas Bock 2
1
Max Planck Institute for Human Cognitive and
Brain Sciences, Leipzig, Germany,
2
McMaster
University, Ontario, Canada
This work studies a newly proposed morphometric
measurement in the cerebral cortex, the myelinated
thickness and myelinated thickness ratio, in the context
of high resolution 7 Tesla imaging. A new algorithm for
myelinated thickness estimation is proposed, and the
measures extracted from T1-weighted and quantitative T1
contrasts are compared at multiple resolutions.
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