Abstract #2841

Ink-Net: Safe 256 Channel EEG at 7T

Daniel G. Wakeman¹, Boris Keil¹, Bill McSwain², Maria Ida Iacono¹, Catherine Poulsen², Giorgio Bonmassar¹

¹A.A. Martinos Center for Biomedical Imaging, Harvard Medical School, Radiology, Massachusetts General Hospital, Charlestown, MA, United States; ²Electrical Geodesics, Inc., Eugene, OR, United States

We show safety testing of a new 256 channel EEG device at 7T. Previous studies have shown that high density EEG caps in high field strength MRI (3 & 7T can generate high SAR. We performed SAR simulations and Temperature measurements on a conductive phantom to test the risk of heating.