Simulataneous B1 and B0 Mapping at 7T

Walter RT Witschey¹, Ravinder Reddy¹, Mark A. Elliott¹

A modification of the actual flip angle (AFI) method for measuring B1 is presented which simultaneously acquires spatial maps of both B0 and B1, allowing for accurate calculation of the radiofrequency field in the presence of off-resonance effects. An analytical expression for the actual B1 field is derived, given the apparent flip angle and the B0 map. Application of the new method is demonstrated at 7 tesla in phantom images.