Daniel J Martire1, Krzysztof Wawrzyn1, William Bradfield Handler1, and Blaine A Chronik1
In this project, a method to quantify the
gradient-induced vibration of a medical device in an MR system using a laser
Doppler vibrometer is presented. A copper annulus was suspended in a 3T
scanner, at a position chosen to maximize the x-component of the x-gradient.
The displacement of the device was measured at different gradient field
strengths. Typical observations were understood, which should lead towards
helping establish a test standard for gradient induced vibrations of implanted
medical devices.