Advanced
methods for imaging around metallic implants yield most benefit in the
neighborhood around the implant. However, due to the extent of the anatomy in
the region of the implant, large field of view acquisitions are often required.
In this work, it is shown that a low-resolution acquisition can be used to
inform a subsequent reduced field of view acquisition. Significant reductions in
the imaged field of view are possible due to the combination of both spatially
varying coil sensitivity profiles along with spatially varying resonance
frequency bins. Artifact free regions in the neighborhood of the implant are
possible with extreme field of view reductions because of the rapid spatial
variability of the imaged resonance frequency bins.
