Zhiyong Zhang1,2, Amir Seginer1, and Lucio Frydman1
1Chemical Physics, Weizmann Institute of Science, Rehovot, Israel, 2Electronic Science, Xiamen University, Xiamen, China, People's Republic of
Magnetic resonance imaging (MRI) near metallic implants remains an
unmet need because of severe artifacts, which mainly stem from large
metal-induced field inhomogeneities. The single-scan cross spatiotemporal
encoding (xSPEN) technique delivers in-plane distortion-free 2D images under
such large field inhomogeneity condition, while the slice-plane displacement,
“signal voids” and “pile-up” effects are proposed to be solved by applying t1-evolution-time encoding on
the multi-slicing 2D xSPEN technique. Compared to the popular “SEMAC” and
“MAVIC” techniques, the remarkable time efficiency of this t1-encoding xSPEN thus enable many advanced MRI
applications near metal implants with another additional dimension, such as diffusing
MRI, function MRI.
